Stage
size
|
210*210mm
|
Titling
rang
|
150*150mm
|
Force
|
0.05-50mg
|
Tip
radius
|
R角:1
um(30°),
2.0um(60°)
|
Vertical
range
|
±180
um
|
可量測最小深度及高度
|
±50
Å
|
Sample
thickness
|
52mm
|
掃瞄範圍
|
100*150mm
|
X軸真直度
|
0.005um/5mm,
0.1um/100mm
|
Y軸真直度
|
5um/100mm
|
camera
|
1/2inch
CCD(768*494)
|
放大倍率
|
140倍(固定)
|
Vertical
resolution垂直解析度
|
1
Å
|
縱軸解析度Y
|
最高1
um
|
橫軸解析度X
|
最高0.01um,不能定位座標
|
repeatability
|
0.5nm
|
※最大可量測之深度或高度為180
um,請勿超過,否則探針將會折斷。
|